Ampirica, LLC
2118 Walsh Ave #230
Santa Clara, CA 95050


Patents

#CountryPatent NoDate IssuedInventorsTitle
1USAUS 71588971/2/2007Vladimir Gammer, Mikhail Spitkovsky, Leonid Matsiev, Oleg KolosovIntegrated circuitry for controlling analysis of a fluid
2USAUS 70733707/11/2006Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using a Mechanical Resonator
3USAUS 70439695/16/2006Leonid Matsiev, James Bennett, Daniel M. Pinkas, Mikhail Spitkovsky, Oleg Kolosov, Shenheng Guan, Mark Uhrich, G. Cameron Dales, John F. Varni, Blake Walker, Vladimir Gammer, David PadowitzMachine Fluid Sensor and Method
4CanadaCA 22903942/28/2006Eric D. Carlson, Adam Safir, Miroslav Petro, Ralph B. Nielsen, Howard Turner, Jean M.J. Frechet, G. Cameron Dales, Sigrid C. Kuebler, James BennettRapid Characterization Of Polymers
5GermanyDE 29825207.42/9/2006Leonid Matsiev, James Bennett, Eric McFarlandMethod and Apparatus for Characterizing Materials By Using aMechanical Resonator
6USAUS 695756510/25/2005Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using A Mechanical Resonator
7EPCEP 118407310/12/2005G. Cameron Dales, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Eric McFarlandParallel Reactor with Internal Sensing and Method of Using Same
8USAUS 69364718/30/2005Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievInstrument For High Throughput Measurement Of Material Physical Properties And Method Of Using Same
9USAUS 69288778/16/2005Eric D. Carlson, Oleg Kolosov, Leonid Matsiev, Laura T. Mazzola, Mikhail Spitkovsky, John GallipeoHigh Throughput Microbalance And Methods of Using Same
10USA US 68813634/19/2005Eric D. Carlson, Damian Hajduk, Leonid Matsiev, Adam Safir, Paul Mansky High Throughput Preparation And Analysis Of Materials
11USA US 68739163/29/2005Oleg Kolosov, Leonid Matsiev, Mikhail Spitkovsky, Vladimir Gammer Application Specific Integrated Circuitry For Controlling Analysis For a Fluid
12USAUS 68640923/8/2005Turner, H. G. Cameron Dales Lynn Van Erden Johannes A.M. van Beek Damian Hajduk Ralph B. Nielsen Paul Mansky Leonid Matsiev Pei Wang Eric McFarlandParallel Reactor With Internal Sensing and Method of Using Same
13USA US 68411271/11/2005Trevor G. Frank, Keith Anthony Hall, William H. Chandler, Jr., Thomas R. Boussie, Thomas Crevier, Leonid Matsiev, Christopher Goh In-Situ Injection and Materials Screening Device
14USA US 68380521/4/2005Trevor G. Frank, Keith Anthony Hall, William H. Chandler, Jr., Thomas R. Boussie, Thomas Crevier, Leonid Matsiev In-Situ Injection and Materials Screening Device
15USA US 681818311/16/2004Damian Hajduk, Ralph B. Nielsen, Adam Safir, Leonid Matsiev, Eric McFarland, Paul Mansky Multi-Temperature Modular Reactor and Method of Using Same
16USA US 681811011/16/2004Christopher Warren, Robert C. Haushalter, Leonid Matsiev, Martin Devenney, Eric McFarland, Earl Danielson Combinatorial Electrochemical Deposition And Testing System
17USA US 681942011/16/2004Sigrid C. Kuebler, James Bennett Fiber Optic Apparatus And Use Thereof In Combinatorial Material Science
18EPC EP 117418310/20/2004G. Cameron Dales, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Eric McFarland Parallel Reactor With Internal Sensing and Method of Using Same
19EPC EP 116198810/13/2004G. Cameron Dales, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Eric McFarland Parallel Reactor With Internal Sensing and Method of Using Same
20USA US 67726428/10/2004Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property And Bulge Testing Of Materials Libraries
21USA US 67589517/6/2004Daniel M. Giaquinta, Alexander Gorer, Martin Devenney, Sum Nguyen, Leonid MatsievSynthesis and Characterization of Materials For Electrochemical Cells
22USA US 67561096/29/2004Christopher Warren, Robert C. Haushalter, Leonid MatsievCombinatorial Electrochemical Deposition And Testing System
23Japan JP 35461944/16/2004G. Cameron Dales, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Eric McFarlandParallel Reactor With Internal Sensing and Method of Using Same
24USA US 66901792/10/2004Damian Hajduk, Eric D. Carlson, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using Capacitance
25USA US 666823012/23/2003Paul Mansky, James BennettSensor Array-Based System And Method For Rapid Materials Characterization
26CanadaCA 230680711/25/2003G. Cameron Dales, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Eric McFarlandParallel Reactor With Internal Sensing and Method of Using Same
27USAUS 665010211/18/2003Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using a Piezoelectric
28USAUS 66054738/12/2003Damian Hajduk, Rakesh Jain, James BennettApparatus And Method For Characterizing Libraries Of Different Materials Using X-ray Scattering
29Canada CA 23810147/8/2003Leonid Matsiev, Howard Turner, G. Cameron Dales, Pei Wang, Eric McFarland, Ralph B. Nielsen, Damian Hajduk, Johannes A.M. van BeekParallel Reactor With Internal Sensing and Method of Using Same
30USAUS 65358243/18/2003Paul Mansky, James BennettApparatus For Rapid Sensor Array-Based Materials Characterization
31USAUS 65358223/18/2003Paul Mansky, James BennettSensor Array For Rapid Materials Characterization
32USAUS 65280263/4/2003Damian Hajduk, Ralph B. Nielsen, Adam Safir, Leonid Matsiev, Eric McFarland, Paul ManskyMulti-Temperature Modular Reactor and Method of Using Same
33USAUS 65190322/11/2003Sigrid C. Kuebler, James BennettFiber Optic Apparatus And Use Thereof In Combinatorial Material Science
34USAUS 649407912/17/2002Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using a Mechanical Resonator
35USA US 647747911/5/2002Paul Mansky, James BennettSensor Array For Rapid Materials Characterization
36USA US 64553169/24/2002Howard Turner, G. Cameron Dales, Lynn Van Erden, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Pei Wang, Eric McFarland, Johannes A.M. van BeekParallel Reactor With Internal Sensing and Method of Using Same Parallel Reactor With Internal Sensing And Method Of Using Same
37USA US 64384978/20/2002Paul Mansky, James BennettMethod For Conducting Sensor Array-Based Rapid Materials Characterization
38USA US 64015196/11/2002Eric McFarland, Leonid MatsievSystems and Methods for Characterization of Materials and Combinatorial Libraries with Mechanical Oscillators
39USA US 6393895 5/28/2002Leonid Matsiev, James Bennett, Eric McFarlandMethods and Apparatus for Characterizing Materials by Using a Mechanical Resonator
40USA US 63716404/16/2002Damian Hajduk, James Bennett, Rakesh Jain, Damodara Poojary, Daniel M. GiaquintaApparatus and Method for Characterizing Libraries of Different Materials Using X-ray Scattering
41USA US 6336353 1/8/2002Eric McFarland, Leonid Matsiev, James BennettMethods and Apparatus for Characterizing Materials by Using a Mechanical Resonator
42USA US 6187164 2/13/2001Christopher Warren, Robert C. Haushalter, Leonid Matsiev, Eric McFarland, Martin Devenney, Earl DanielsonMethod for Creating and Testing a Combinatorial Array Employing Individually Addressable Electrodes
43USA US 6182499 2/6/2001Eric McFarland, Leonid MatsievSystems and Methods for Characterization of Materials and Combinatorial Libraries with Mechanical Oscillators
44USA US 6175409 1/16/2001Ralph B. Nielsen, Sigrid C. Kuebler, James Bennett, Adam Safir, Miroslav PetroFlow-Injection Analysis and Variable-Flow Light-Scattering Methods and Apparatus for Characterizing Polymers
45RussiaSU 1587337 A18/23/1990O.V. Kolosov, L.F. Matsiev, R.G. Mayev, V.A. Troitskii, Yu.K. Bondarenko and Yu.B. Es'kovMethod of investigation of layered materials and other objects using acoustic microscopy
46RussiaSU 1409915 A17/15/1988O.V. Kolosov, L.F. Matsiev, R.G. Mayev, E.Yu.Lagutemkova, T.A. Senyushkina and M.F. PyshnyiMethod of investigation of object internal structure in transmission acoustic microscope