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Pending Patent Applications

#CountryPublished NoDate PublishedInventorsTitle
1USAUS 2006-021899610/5/2006Leonid Matsiev, James Bennett, Daniel M. Pinkas, Mikhail Spitkovsky, Oleg Kolosov, Shenheng Guan, Mark Uhrich, G. Cameron Dales, John F. Varni, Blake Walker, Vladimir Gammer, David PadowitzMachine Fluid Sensor
2PCTWO 2006/0842638/10/2006Oleg Kolosov, Mikhail Spitkovsky, James BennettMulti-Position Fluid Sensors And Methods
3EPCEP 16447174/12/2006David Padowitz, Leonid Matsiev, Oleg KolosovMechanical Resonator
4USAUS 2006-00310302/9/2006James Bennett, G. Cameron Dales, John M. Feland III, Oleg Kolosov, Eric Low, Leonid Matsiev, William C. Rust, Mikhail Spitkovsky, Mark UhrichPortable Fluid Sensing Device and Method
5USAUS 2005-026294412/1/2005James Bennett, Oleg Kolosov, Leonid MatsievFlexural Resonator Sensing Device And Method
6PCTWO2005/10364511/3/2005James Bennett, Oleg Kolosov, Leonid MatsievFlexural Resonator Sensing Device And Method
7PCTWO2005/10367411/2/2005James Bennett, G. Cameron Dales, John M. Feland III, Oleg Kolosov, Eric Low, Leonid Matsiev, William C. Rust, Mikhail Spitkovsky, Mark UhrichPortable Fluid Sensing Device and Method
8USAUS 2005-02097969/22/2005Oleg Kolosov, Leonid Matsiev, Mikhail Spitkovsky, Vladimir GammerIntegrated Circuitry For Controlling Analysis Of A Fluid
9USAUS 2005-01791568/18/2005Eric D. Carlson, Damian Hajduk, Leonid Matsiev, Adam Safir, Paul ManskyHigh Throughput Preparation And Analysis Of Materials
10USAUS 2005-01666798/4/2005Eric D. Carlson, Oleg Kolosov, Leonid Matsiev, Laura T. Mazzola, Mikhail Spitkovsky, John GallipeoHigh Throughput Microbalance And Methods of Using Same
11USAUS 2005-01450197/7/2005Leonid Matsiev, Oleg Kolosov, Mark Uhrich, William C. Rust, John M. Feland III, John F. Varni, Blake WalkerEnvironmental Control System Fluid Sensing System and Method
12USAUS 2005-01492767/7/2005Oleg Kolosov, Leonid Matsiev, Mikhail Spitkovsky, Vladimir GammerApplication Specific Integrated Circuitry For Controlling Analysis For a Fluid
13EPCEP 15374036/8/2005Eric D. Carlson, Oleg Kolosov, Leonid Matsiev, Laura T. Mazzola, Mikhail Spitkovsky, John GallipeoHigh Throughput Microbalance And Methods of Using Same
14USA US 2004-0250622 A112/16/2004Oleg Kolosov, Leonid Matsiev, John F. Varni, G. Cameron Dales Resonator Sensor Assembly
15USA US 2004-0244487 A112/9/2004Oleg Kolosov, Leonid Matsiev, David Padowitz Mechanical Resonator
16PCT WO 2004/086020 A210/7/2004Oleg Kolosov, Leonid Matsiev, Mikhail Spitkovsky, Vladimir GammerApplication Specific Integrated Circuitry For Controlling Analysis For a Fluid
17PCT WO 2004/086003 A110/7/2004Oleg Kolosov, Leonid Matsiev, John F. Varni, G. Cameron Dales, Olaf Ludtke (Hella), Dirk Wullner (Hella), Andreas Buhrdorf (Hella), Heiko Dobrinski (Hella)Resonator Sensor Assembly
18PCT WO 2004/086002 A110/7/2004Oleg Kolosov, Leonid Matsiev, John F. Varni, G. Cameron DalesResonator Sensor Assembly
19PCT WO 2004/086027 A210/7/2004David Padowitz, Leonid Matsiev, Oleg KolosovMechanical Resonator
20USA US 2004-0155668 A18/12/2004Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using Capacitance
21USA US 2004-0123650 A17/1/2004Oleg Kolosov, Leonid MatsievHigh Throughput Rheological Testing of Materials
22USA US 2004-0113602 A16/17/2004Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using A Piezoelectric
23USA US 2004-0107055 A16/3/2004Oleg Kolosov, Leonid Matsiev, Mikhail Spitkovsky, Vladimir GammerApplication Specific Integrated Circuitry For Controlling Analysis For a Fluid
24USA US 2004-0099050 A15/27/2004Leonid Matsiev, James Bennett, Daniel M. Pinkas, Mikhail Spitkovsky, Oleg KolosovMachine Fluid Sensor And Method
25PCT WO 2004/0062074/29/2004Leonid Matsiev, Oleg Kolosov, Mark Uhrich, John M. Feland III, John F. VarniEnvironmental Control System Fluid Sensing System and Method
26PCT WO 2004/036191 A14/29/2004Leonid Matsiev, James Bennett, Daniel M. Pinkas, Mikhail Spitkovsky, Oleg Kolosov, Shenheng GuanMachine Fluid Sensor And Method
27USA US 2004-0074303 A14/22/2004Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using AMechanical Resonator
28USA US 2004-0074302 A14/22/2004Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using AMechanical Resonator
29EPC EP 13997373/24/2004Trevor G. Frank, Keith Anthony Hall, William H. Chandler Jr., Thomas R. Boussie, Thomas Crevier, Leonid Matsiev, Christopher GohIn-Situ Injection and Materials Screening Device
30USA US 2004-0017896 1/29/2004Damian Hajduk, Rakesh Jain, James BennettApparatus And Method For Characterizing Libraries Of Different Materials Using X-ray Scattering
31PCT WO 03/100390 A212/4/2003Eric D. Carlson, Oleg Kolosov, Leonid Matsiev, Laura T. Mazzola, Mikhail Spitkovsky, John GallipeoHigh Throughput Microbalance And Methods of Using Same
32USA US 2003-0218467 A111/27/2003Eric D. Carlson, Oleg Kolosov, Leonid Matsiev, Laura T. Mazzola, Mikhail Spitkovsky, John GallipeoHigh Throughput Microbalance And Methods of Using Same
33EPC EP 136142911/12/2003Leonid Matsiev, James Bennett, Eric McFarlandMethod and Apparatus for Characterizing Materials By Using aMechanical Resonator
34USA US 2003-0190755 10/9/2003Howard Turner, G. Cameron Dales, Lynn Van Erden, Johannes A.M. van Beek, Damian Hajduk, Ralph B. Nielsen, Paul Mansky, Leonid Matsiev, Pei Wang, Eric McFarlandParallel Reactor With Internal Sensing And Method Of Using Same
35USA US 2003-01423097/31/2003Sigrid C. Kuebler, James BennettFiber Optic Apparatus And Use Thereof In Combinatorial Material Science
36USA US 2003-01277767/10/2003Eric D. Carlson, Damian Hajduk, Leonid Matsiev, Adam Safir, Paul ManskyHigh Throughput Preparation And Analysis Of Materials
37EPC EP 13253117/9/2003Sigrid C. Kuebler, James BennettFiber Optic Apparatus And Use Thereof In Combinatorial Material Science
38EPCEP 1308722 A25/7/2003Eric D. Carlson, Adam Safir, Miroslav Petro, Ralph B. Nielsen, Howard Turner, Jean M.J. Frechet, G. Cameron Dales, Sigrid C. Kuebler, James BennettRapid Characterization Of Polymers
39EPCEP 1308723 A25/7/2003Eric D. Carlson, Adam Safir, Miroslav Petro, Ralph B. Nielsen, Howard Turner, Jean M.J. Frechet, G. Cameron Dales, Sigrid C. Kuebler, James BennettRapid Characterization Of Polymers
40USAUS 2003-00709174/17/2003Daniel M. Giaquinta, Alexander Gorer, Martin Devenney, Sum Nguyen, Leonid MatsievSynthesis and Characterization of Materials For Electrochemical Cells
41PCTWO 03/0191503/6/2003Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using Fluid, Voltage And Piezoelectric
42USAUS 2003-0041653 3/6/2003Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using AMechanical Resonator
43USAUS 2003-00416713/6/2003Damian Hajduk, Eric D. Carlson, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using Capacitance
44USAUS 2003-0041672 3/6/2003Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property And Bulge Testing Of Materials Libraries
45USAUS 2003-00416763/6/2003Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievHigh Throughput Mechanical Property Testing Of Materials Libraries Using A Piezoelectric
46USA US 2003-0045000 3/6/2003Trevor G. Frank, Keith Anthony Hall, William H. Chandler Jr., Thomas R. Boussie, Thomas Crevier, Leonid Matsiev, Christopher GohIn-Situ Injection and Materials Screening Device
47USA US 2003-0026736 2/6/2003Damian Hajduk, Ralph B. Nielsen, Adam Safir, Leonid Matsiev, Eric McFarland, Paul ManskyMulti-Temperature Modular Reactor and Method of Using Same
48PCT WO 03/003003 A21/9/2003Trevor G. Frank, Keith Anthony Hall, William H. Chandler Jr., Thomas R. Boussie, Thomas Crevier, Leonid Matsiev, Christopher GohIn-Situ Injection and Materials Screening Device
49USAUS 2003-00030171/2/2003Trevor G. Frank, Keith Anthony Hall, William H. Chandler Jr., Thomas R. Boussie, Thomas Crevier, Leonid MatsievIn-Situ Injection and Materials Screening Device
50USA US 2003-0000291 1/2/2003Leonid Matsiev, Miroslav Petro, Oleg KolosovFlow Detectors Having Mechanical Oscillators, and Use Thereof in Flow Characterization Systems
51PCTWO 02/099414 A112/12/2002Leonid Matsiev, Miroslav Petro, Oleg KolosovFlow Detectors Having Mechanical Oscillators, and Use Thereof in Flow Characterization Systems
52USAUS 2002-0178787 12/5/2002Leonid Matsiev, James Bennett, Eric McFarlandMethod And Apparatus For Characterizing Materials By Using A Mechanical Resonator
53USAUS 2002-0155036 10/24/2002Damian Hajduk, Ralph B. Nielsen, Adam Safir, Leonid Matsiev, Eric McFarland, Paul ManskyMulti-Temperature Modular Reactor and Method of Using Same
54USA US 2002-0100692 A18/1/2002Christopher Warren, Robert C. Haushalter, Leonid MatsievCombinatorial Electrochemical Deposition and Testing Systems
55USA US 2002-0098332 A17/25/2002Christopher Warren, Robert C. Haushalter, Leonid MatsievCombinatorial Electrochemical Deposition and Testing System
56PCT WO 02/31477 A24/18/2002Sigrid C. Kuebler, James BennettFiber Optic Apparatus and Use Thereof in Combinatorial Material Science
57USA US 2002-0029621 3/14/2002Damian Hajduk, Eric D. Carlson, J. Christopher Freitag, Oleg Kolosov, James R. Engstrom, Adam Safir, Ravi Srinivasan, Leonid MatsievInstrument for High Throughput Measurement of Material Physical Properties and Method of Using Same
58USA US 2002-0032531 3/14/2002Paul Mansky, James BennettSensor Array for Rapid Materials Characterization
59USA US 2002-00284563/7/2002Paul Mansky, James BennettMethod for Conducting Sensor Array-Based Rapid Materials Characterization
60USA US 2001-0010174 8/2/2001Leonid Matsiev, James Bennett, Eric McFarlandMethods and Apparatus for Characterizing Materials by Using A Mechanical Resonator
61USA US 2001-00101748/2/2001Eric McFarland, Leonid Matsiev, James BennettMethods and Apparatus for Characterizing Materials by Using A Mechanical Resonator
62PCT WO 00/36410 A16/22/2000Paul Mansky, James BennettApparatus for Rapid Sensor Array-Based Materials Characterization
63PCT WO 00/36405 A36/22/2000Damian Hajduk, James Bennett, Rakesh JainApparatus and Method for Characterizing Libraries of Different Materials Using X-Ray Scattering
64PCT WO 00/36405 A26/22/2000Damian Hajduk, James Bennett, Rakesh JainApparatus and Method for Characterizing Libraries of Different Materials Using X-Ray Scattering
65EPC WO 99/51980 A210/14/1999Eric D. Carlson, Adam Safir, Miroslav Petro, Ralph B. Nielsen, Howard Turner, Jean M.J. Frechet, G. Cameron Dales, Sigrid C. Kuebler, James BennettRapid Characterization of Polymers
66PCT WO 99/51980 A210/14/1999Eric D. Carlson, Adam Safir, Miroslav Petro, Ralph B. Nielsen, Howard Turner, Jean M.J. Frechet, G. Cameron Dales, Sigrid C. Kuebler, James BennettRapid Characterization of Polymers
67EPC EP 943091 A19/22/1999Leonid Matsiev, James Bennett, Eric McFarlandMethod and Apparatus for Characterizing Materials by Using a Mechanical Resonator
68PCT WO 99/18431 A14/15/1999Leonid Matsiev, James Bennett, Eric McFarlandMethod and Apparatus for Characterizing Materials by Using a Mechanical Resonator
69PCT WO 98/15501 A34/16/1998Eric McFarland, Leonid MatsievSystems and Methods for Characterization of Materials and Combinatorial Libraries with Mechanical Oscillators